JEDEC規格一覧

JESD22-A104D規格

This standard provides a method for determining solid state devices capability to withstand extreme temperature cycling. Changes in this revision include requirements that the worst-case load temperature must reach the specific extremes rather than just requiring that the chamber ambient temperature reach the extremes. This ensures that the test specimens will reach the specified temperature extremes regardless of chamber loading. Definitions are provided for Load, Monitoring Sensor, Worst-Case Load Temperature, and Working Zone. The transfer time has been tightened from 5 minutes to 1 minute. Five new test conditions have been added as well as a caution on test conditions which exceed the glass transition temperature of plastic package solid devices.

JESD22-A104D規格に対応可能な企業

中央電子工業株式会社 【熊本県宇城市】
問い合わせ
自社で製造する半導体、人工衛星などに使用される高信頼度製品で培った試験・評価技術/設備をもとに、信頼性試験や高信頼度製品の評価を受託します。MIL-STD-202/750/883をはじめとする各種試験規格にも対応できます。

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