JEDEC規格一覧

JESD22-A104D規格

This standard provides a method for determining solid state devices capability to withstand extreme temperature cycling. Changes in this revision include requirements that the worst-case load temperature must reach the specific extremes rather than just requiring that the chamber ambient temperature reach the extremes. This ensures that the test specimens will reach the specified temperature extremes regardless of chamber loading. Definitions are provided for Load, Monitoring Sensor, Worst-Case Load Temperature, and Working Zone. The transfer time has been tightened from 5 minutes to 1 minute. Five new test conditions have been added as well as a caution on test conditions which exceed the glass transition temperature of plastic package solid devices.

JESD22-A104D規格に対応可能な企業

ナノサイエンス株式会社 【東京都豊島区】
問い合わせ 設備情報一覧
【表面分析、信頼性試験の受託】各種表面分析(不純物分析、組成分析、形態観察/構造解析)及び、EIAJ規格、JEDEC規格、MIL規格などに対応した電子部品の環境試験、ESD試験などを実施。標準試料も販売。

JESD22-A104D規格に
対応可能な企業 募集中!

試験・分析人気検索ランキング おすすめ動画
▲このページの上部へ